The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2003
Filed:
Aug. 06, 2002
Anthony Kelly, Limerick, IE;
Jeffrey C. Gealow, Andover, MA (US);
Analog Devices, Inc., Norwood, MA (US);
Abstract
A sample rate conversion system developed to implement a rate change of M/N using a very efficient design implementation. The sample rate conversion system of the present invention is implemented as a CIC-based interpolating sample rate converter with noise-shaped control of the N value. For a decimator, noise-shaped control of the M value is utilized. In the interpolator, the N value is the correct value on average, but demonstrates instantaneous errors (“non-uniform” resampling) that are corrected through noise-shaping. The CIC SRC implementation capitalizes on the fact that the outputs of the CIC that are discarded during downsampling need not be calculated by the CIC in the first instance. The combination of the computational simplicity of CIC SRC with noise-shaped, non-uniform resampling performs the sample rate conversion very economically and facilitates conversion between a plethora of sample rates at the input and output without requiring the various filters to be explicitly formulated. A method for sample rate conversion is also described.