The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2003
Filed:
Aug. 22, 2001
Applicant:
Inventor:
William K. Zuravleff, Mountain View, CA (US);
Assignee:
Aurora Systems, Inc., San Jose, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/100 ; G02F 1/136 ; G09G 5/00 ;
U.S. Cl.
CPC ...
G01R 3/100 ; G02F 1/136 ; G09G 5/00 ;
Abstract
A test method ( ) for testing a reflective LCD array ( ) and apparatus including a mirror read pass transistor ( ). In the reflective LCD array ( ) has a plurality of system cells ( ), wherein data is written to a mirror ( ). A measurement device ( ) which, in one embodiment is a mirror read pass transistor ( ) allows read back of voltage on the mirror ( ), thereby providing a measurable criteria for determining if the mirror ( ) a mirror electrical contact ( ) and associated driving circuitry such as a master cell ( ), a slave cell ( ) and an analog mux ( ) are properly connected and functioning.