The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2003

Filed:

Oct. 12, 2001
Applicant:
Inventors:

Julie Camille DiCarlo, Stanford, CA (US);

Dwight G. Nishimura, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 ;
U.S. Cl.
CPC ...
G01V 3/00 ;
Abstract

Real time spatially localized velocity distribution is measured using magnetic resonance techniques by first exciting a column-shaped region using a 2D RF excitation pulse. A cyclical readout gradient is then played along the excited column's axis while the magnetic resonance signal is continuously sampled to create a 2D sample set of velocity frequency vs. spatial frequencies in the same direction. If the cyclical readout gradient, for example a sawtooth-shaped gradient, has lobes of increasing area, the spacing between samples in the velocity-frequency direction is increased to emphasize sampling at low velocity-frequency and to more coarsely sample high velocity-frequencies. The sequence can be repeated to collect a time series of velocity-position images, which can then be sampled to create a velocity-time image at a single location.


Find Patent Forward Citations

Loading…