The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2003
Filed:
Aug. 24, 2001
Damian A. Hajduk, San Jose, CA (US);
Eric D. Carlson, Cupertino, CA (US);
J. Christopher Freitag, Santa Clara, CA (US);
Oleg Kolosov, San Jose, CA (US);
James R. Engstrom, Ithaca, NY (US);
Adam Safir, Berkeley, CA (US);
Ravi Srinivasan, Mountain View, CA (US);
Leonid Matsiev, San Jose, CA (US);
Symyx Technologies, Inc., Santa Clara, CA (US);
Abstract
The present invention provides instruments and methods for screening combinatorial libraries that addresses many of the problems encountered when using conventional instruments. For example, the disclosed instruments can measure mechanical properties of library members in rapid serial or parallel test format, and can perform tests on small amounts of material, which are easily prepared or dispensed using art-disclosed liquid or solid handling techniques. Compared to conventional instruments, the disclosed instruments afford faster sample loading and unloading, for example, through the use of disposable libraries of material samples.