The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2003
Filed:
Nov. 13, 2001
Michael A. DellaVecchia, Berwyn, PA (US);
Larry Donoso, Philadelphia, PA (US);
Mikhail A. Vorontsov, Laurel, MD (US);
Gary Cathcart, Elkton, MD (US);
Leonid I. Beresnev, Columbia, MD (US);
Matt Banta, Baltimore, MD (US);
Philadelphia Retina Endowment Fund, Philadelphia, PA (US);
Abstract
A method for compensating an optic aberration of an eye comprising the steps of applying to the eye a measuring light beam formed of incoherent light to provide an applied incoherent measuring light beam. An image quality metric is determined in accordance with the applied incoherent measuring light beam and the aberration is compensated in accordance with said image quality metric. A perturbation is applied to the image quality metric to provide a perturbed image quality metric and a determination is made whether a predetermined image quality is obtained in accordance with the perturbed image quality metric. An incoherent source light is transmitted from an incoherent light source to a mirror and redirected from the incoherent light source to the retina of the eye using the mirror in order to provide the applied incoherent measuring light beam.