The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2003

Filed:

Mar. 27, 2002
Applicant:
Inventors:

Chikara Murata, Shizuoka, JP;

Tomohisa Yamamoto, Shizuoka, JP;

Masami Hirabayashi, Inazawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41L 3/02 ;
U.S. Cl.
CPC ...
B41L 3/02 ;
Abstract

There is provided a marking apparatus, a marking method, and a marking system that enable the position of a marking target to be accurately shown, and that reliably enable only that portion containing the marking target to be removed. The marking system has a detector that detects a marking target on a subject material and acquires the position thereof, a marking apparatus having heads capable of marking an optional position in the transverse direction of the subject material, and a control apparatus that sends a marking instruction to the marking apparatus when the position of the marking target in the transverse direction arrives at the marking apparatus, and the position of the marking target matches the position of a head of the marking apparatus.


Find Patent Forward Citations

Murata, Chikara. (2003). Marking system, marking method and marking apparatus (U.S. Patent No. 6647885). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6647885

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…