The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2003
Filed:
Nov. 08, 2001
Jeff Brown, Fort Collins, CO (US);
LSI Logic Corporation, Milpitas, CA (US);
Abstract
An on-chip apparatus and method for measuring signal skew between two on-chip signals are provided. The apparatus and method generate a pulse train which is at a first state during a time period between a clocking of a circuit component and a time at which the circuit component generates an output signal, and a second state between clockings of the circuit component. The pulse width of the pulses in the pulse train is representative of the skew, i.e. change of phases or timing, in the signal due to the presence of the component. The pulse train may further be pseudo-clock divided to generate more measurable pulses. The output from is produced using a single output pad. The apparatus and method produce a long measurable pulse width on a single output pad. A pulse width of 10 s of ns is achievable instead of 1-2 ns as in the known art. The pulse width measurement is done with a single tester channel instead of two as in the known art.