The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2003
Filed:
Nov. 15, 2000
Applicant:
Inventor:
Harland Glenn Hopkins, Missouri City, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/128 ; G06F 1/100 ;
U.S. Cl.
CPC ...
G01R 3/128 ; G06F 1/100 ;
Abstract
An electronics testing circuit comprises a tested circuit ( ) which includes testing cells ( ) and a first transceiver ( ) coupled to the cells ( ). The first transceiver ( ) is operable to transmit signals received from the testing cells ( ) and to receive signals transmitted for the cells ( ). A second transceiver ( ) is operable to receive signals from the first transceiver ( ) and send signals to the first transceiver ( ). A testing device ( ) is coupled to the second transceiver ( ) and is operable to send signals to it for the testing cells ( ) and receive signals from the testing cells ( ).