Coverage-based test generation for microprocessor verification

Abstract

An integrated circuit verification method and system are disclosed. The method includes generating a test description comprising a set of test cases. The functional coverage achieved by the test description is then determined. The functional coverage achieved is then compared against previously achieved functional coverage and the test description is modified prior to simulation if the test description achieves no incremental functional coverage. In one embodiment, generating the test description comprises generating a test specification and providing the test specification to a test generator suitable for generating the test description. In one embodiment, the test description comprises a generic test description and the generic test description is formatted according to a project specification and simulation environment requirements. If the coverage achieved by the test description satisfies the test specification. In one embodiment, the functional coverage achieved by the test description is displayed in a graphical format. The test description is preferably added to a test database if the coverage achieved by the test description satisfies the test specification. The attributes and description of functional coverage achieved is added to the coverage database. Determining the functional coverage achieved by a test description may include estimating the coverage achieved based upon the test description, the test specification, and functional coverage model.