The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2003
Filed:
Sep. 22, 2000
Dimitry M. Gorinevsky, Palo Alto, CA (US);
Honeywell Inc., Morristown, NJ (US);
Abstract
Process control methods and apparatus for controlling batch processes including batch heating processes. The present invention includes iterative learning control (ILC) techniques to provide improved run-to-run process control. One method provides a desired temperature profile over the length of a batch time period. This method gathers historical measured value data over the length of a first batch run which can be converted to deviation or error historical data, as well as a historical output history of outputs provided to control the process for the first run. The historical deviation and output histories from the first run can then be used to generate the output profile for a second batch run. Thus, the outputs from a first batch, such as the output to a local heater control, together with the deviation or error history from the first batch run, can be added to the output value provided during the previous batch to generate new output value to be used to control a second batch run.