The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2003
Filed:
Oct. 03, 2001
Robert Madge, Portland, OR (US);
LSI Logic Corporation, Milpitas, CA (US);
Abstract
A method for identifying an integrated circuit having a latent defect. Test data corresponding to a set of integrated circuits is obtained, where the set of integrated circuits was processed on a single substrate. A subject integrated circuit is selected for analysis from within the set. A subset of integrated circuits is identified from within the set, where the subset includes integrated circuits that were located in close proximity on the substrate to the subject integrated circuit. The test data for the subset is analyzed to determine a defect parameter for the subset. The defect parameter for the subset is compared to a threshold. The subject integrated circuit is classified as having a latent defect when the defect parameter for the subset violates the threshold, and the subject integrated circuit is classified as not having a latent defect when the defect parameter for the subset does not violate the threshold.