The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2003
Filed:
Feb. 12, 2003
Applicant:
Inventors:
Martin Schmidt, Bad Schwartau, DE;
Wilhelm Duis, Hetlingen, DE;
Assignee:
Möller-Wedel GmbH, Wedel, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 2/100 ;
U.S. Cl.
CPC ...
G02B 2/100 ;
Abstract
The microsurgical microscope system with a stand with three parallelogram linkages and a microscope arranged thereon is characterized in that a second parallelogram linkage and a third parallelogram linkage have a common bar inclined at an angle of approximately 30° to 60° to the vertical.
Schmidt, Martin. (2003). Microsurgical microscope system (U.S. Patent No. 6646798). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6646798
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile