The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2003

Filed:

Jan. 28, 2002
Applicant:
Inventors:

Simon P. Parry, Harlow, GB;

Eric S. Maniloff, Kanata, CA;

Gary Mak, Ottawa, CA;

Andy Rowland, Kanata, CA;

Franz H. Mok, Kanata, CA;

Assignee:

Nortel Networks Limited, St. Laurent, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01S 3/00 ;
U.S. Cl.
CPC ...
H01S 3/00 ;
Abstract

In a method and apparatus for tracking dynamic characteristics of an optical amplifier, optical signal probes are used to determine the gain and the corner frequency of the optical amplifier. A first optical probe having a predetermined modulation frequency above an expected corner frequency of the amplifier is used to estimate the gain of the optical amplifier. A second optical probe signal having a second predetermined modulation frequency at or below the expected corner frequency of the amplifier is used to estimate the corner frequency. These parameters can be used to optimize gain control of an optical amplifier.


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