The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2003

Filed:

Feb. 19, 2000
Applicant:
Inventors:

Mervin L. Gangstead, Garland, TX (US);

Wieland E. von Behrens, Hillsborough, CA (US);

James R. Boyd, Plano, TX (US);

Jean-Charles Pina, Duncanville, TX (US);

Jerry B. West, DeSoto, TX (US);

Assignee:

MWI, Inc., Dallas, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/100 ;
U.S. Cl.
CPC ...
G01N 2/100 ;
Abstract

The present invention relates to an optical system for an apparatus for multi-part differential particle discrimination to facilitate analysis, classification, and sorting of various fluid components for presentation. The optical system is characterized by one or more of the following: a synchronized illumination beam and flow cell conduit, a flow cell arrangement to control back reflection, and light sensor arrangement to particularly gather a specific range of light scatter, such specific range of light scatter directly corresponding to at least one type of particle capable of being identified by the apparatus.


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