The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2003
Filed:
May. 03, 2002
Lars Gärdin, Västerås, SE;
Peder Hellberg, Ramnäs, SE;
Westinghouse Atom AB, Västerås, SE;
Abstract
A method and an arrangement for inspection of a test object ( ) for stains or pits at its surface and measuring of any stain or pit, where the test object is arranged in an inspection fixture ( ) in at least one defied position. A monitoring device ( ) and a scanning device ( ) are arranged at the inspection fixture and a control unit ( ) for controlling the inspection is included in the arrangement. The surface of the test object is monitored by means of the monitoring device ( ) and an image, produced by the monitoring device is shown at the control unit. A stain or pit shown by the monitoring device is subsequently scanned by mean of the scanning device and the depth or width of the stain or pit is calculated, dependent of the results of the scanning device.