The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2003
Filed:
Apr. 24, 2001
Kazushi Sugiura, Hyogo, JP;
Katsuya Furue, Tokyo, JP;
Other;
Abstract
A semiconductor device testing method is disclosed which comprises a first process , a second process and a third process . In the first process , a test function part of a semiconductor device having a built-in self-test function is subjected to a self-diagnostic test, and a main circuit part of the device in question is tested by its test function part. If the result of either of the two tests on the device turns out to be abnormal, the device in question is rejected as defective. The test results are saved. In the second process , the main circuit part of each semiconductor device rejected as defective in the first process is tested by use of an external test signal. If the result of the test on the semiconductor device judged faulty in the first process turns out to be normal in the second process , then the device in question is judged normal in the third process