The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2003

Filed:

May. 17, 2001
Applicant:
Inventors:

Carl P. Babcock, Campbell, CA (US);

Jayendra D. Bhakta, Sunnyvale, CA (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 2/1762 ; H01L 2/1311 ;
U.S. Cl.
CPC ...
H01L 2/1762 ; H01L 2/1311 ;
Abstract

Shallow trench isolation among transistors and other devices on a semiconductor substrate is provided by initially forming a layer of highly absorbing silicon rich nitride to serve as a hardmask between a semiconductor substrate and a photoresist. The highly absorbing layer of silicon rich nitride has an extinction coefficient (k)>0.5. As reflected light passes through the layer of silicon rich nitride, a substantially amount of light is absorbed therein thereby blocking such reflected light from negatively interfering with patterning of the photoresist during photo-lithography. Following patterning of the photoresist, isolation trenches are formed in the semiconductor substrate by etching through the silicon rich nitride in accordance with the pattern formed on the photoresist.


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