The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6645858 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 11, 2003

Filed:

Jun. 06, 2001
Applicant:
Inventors:

Sung Gyu Pyo, Ichon-Shi, KR;

Si Bum Kim, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 2/144 ; H01L 2/14763 ; H05H 1/00 ;
U.S. Cl.
CPC ...
H01L 2/144 ; H01L 2/14763 ; H05H 1/00 ;
Abstract

A method of manufacturing a copper metal wiring in a semiconductor device, by which a plasma process is performed before a diffusion barrier layer is formed and a chemical pre-process using a chemical enhancer is performed so that copper is deposited to form a metal wiring by a chemically enhanced chemical vapor deposition (CECVD) method. The method allows the chemical enhancer to be adhered on the diffusion barrier layer uniformly and stably; therefore, improving the deposition property of a copper thin film.


Find Patent Forward Citations

Pyo, Sung. (2003). Method of catalyzing copper deposition in a damascene structure by plasma treating the barrier layer and then applying a catalyst such as iodine or iodine compounds to the barrier layer (U.S. Patent No. 6645858). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6645858

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