The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2003
Filed:
Feb. 24, 2000
Applicant:
Inventors:
Assignee:
Seiko Instruments Inc., , JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01L 3/00 ;
U.S. Cl.
CPC ...
B01L 3/00 ;
Abstract
A sample observation plate is provided which is smooth in a surface in molecular levels and cheap in price, thereby making feasible topological and optical observation in molecular levels. In a sample observation plate to be used on an apparatus for observation of topological and optical information in molecular levels, the sample observation plate is structured by bonding a crystalline thin film on a glass plate. Furthermore, using this sample observation plate, an observation apparatus is structured.