The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2003

Filed:

Mar. 13, 2000
Applicant:
Inventor:

Hiroshi Watanabe, Machida, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ;
U.S. Cl.
CPC ...
G06F 1/750 ;
Abstract

To make it possible to locate a physically abnormal portion such as low-resistance short-circuiting between signal wirings or an open fault in a CMOS logic circuit without any design information, in a fault portion locating method for a semiconductor integrated circuit device, a first information table showing a correspondence between a physical abnormality and a defined abnormal I change mode is prepared in advance, a second information table showing a relationship between a model of the physical abnormality and a change of a light emitting element for the I abnormal pattern in an operation test pattern by emission analysis is prepared in advance, and in fault analysis, the tables are compared with the abnormal I obtained from the actual integrated circuit and the change of the light emitting element, respectively, to locate a physically abnormal portion.


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