The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2003

Filed:

Jan. 26, 2000
Applicant:
Inventors:

Vinay Bhaskar Jammu, Niskayuna, NY (US);

Richard Gerald Bliley, Erie, PA (US);

William Roy Schneider, Erie, PA (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/100 ;
U.S. Cl.
CPC ...
G06F 1/100 ;
Abstract

A method for analyzing fault log data and repair data to estimate time before a machine-disabling failure occurs is provided. The method allows for searching in a database of historical fault log data from a plurality of machines for the occurrence of respective fault patterns indicative of incipient failures of a respective machine subsystem. The method further allows for searching in a database of historical repair data for respective repairs executed on the respective machine subsystem. The method also allows for computing elapsed time between respective occurrences of the fault patterns and the executed repairs.


Find Patent Forward Citations

Jammu, Vinay. (2003). Method and system for estimating time of occurrence of machine-disabling failures (U.S. Patent No. 6643801). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6643801

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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