The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2003
Filed:
Mar. 01, 2001
Hua-Ching Su, Milpitas, CA (US);
Taiki Sakata, Sunnyvale, CA (US);
Charles Herman, Dublin, CA (US);
Steven Dolins, Highland Park, IL (US);
Hitachi, Ltd., Tokyo, JP;
Abstract
A method of analyzing data contained in a very large database or data warehouse includes applying first a patient rule induction method with selected input variables and an output variable to develop a region containing a subset of database records having a highest average output value. Then, the subset of records may be aggregated, sorted, compared, or new measures computed, preferably using an on line analytical processing function, for an pattern analysis of the subset records. An alternative is to apply a weighted item set function to the subset to produce a reduced subset, and then applying the reduced subset to on line analytical processing for pattern analysis.