The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2003
Filed:
Dec. 12, 2002
Yiping Ding, Dover, MA (US);
Pierre Fiorini, Nashua, NH (US);
BMC Software, Inc., Houston, TX (US);
Abstract
Analytic tests are used to detect chaotic (power-tail) behavior in one or more computer system resources in a distributed computing environment. The analytic tests are used to determine if data (indicative of one or more parameters related to computer system resources) exhibit large deviations from a mean, a high variance and other properties consistent with large values in the tail portion of a power-tail distribution. The tests can be performed in any order, and fewer than three can be performed. If all three tests indicate the existence of power-tail behavior, chaotic behavior of the data is likely. If all three tests indicate the lack of power-tail behavior, chaotic behavior of the data is unlikely. If the results are mixed, then more data or analysis may be needed. The results may be used for modeling and/or altering the configuration of the distributed computing environment.