The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2003

Filed:

Jul. 01, 2002
Applicant:
Inventors:

John J. McGee, Manchester, NH (US);

John Michael Earley, Amherst, NH (US);

David M. Heath, Windham, NH (US);

Ralph L. Beck, Sterling, MA (US);

Michael B. Courtemanche, Hollis, NH (US);

Assignee:

Altaworks Corporation, Nashua, NH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/900 ;
U.S. Cl.
CPC ...
G06F 1/900 ;
Abstract

A system and method for monitoring a set of performance metrics is described. The methods include metric correlation and grouping methods that analyze a group of temporally related metrics, and correlate pairs of the metrics in the group. In one embodiment, rank correlation techniques are used to perform this correlation. Methods are also described for grouping metrics using a dynamic correlation pair graph that preserves all of the correlated relationships. This correlation pair graph may be used to determine which metrics are associated with a particular key metric, which may provide information on the cause of an alarm or other event involving the key metric. Another embodiment includes apparatus for correlating, grouping, and identifying the metrics.


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