The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2003

Filed:

Jun. 29, 2000
Applicant:
Inventors:

Qing Yu, Rochester, NY (US);

Jiebo Luo, Rochester, NY (US);

Rajan L. Joshi, Rochester, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract

A digital image processing method determines the extent of blocking artifacts in a digital image by first forming a column difference image and averaging the values in the columns in the column difference image to produce a column difference array. The average of the values in the column difference array that are separated by one block width are computed to produce a block averaged column difference array. Then, the peak value in the block averaged column difference array is located, and the mean value of the block averaged column difference array (excluding the peak value) is calculated to produce a column base value, and the ratio between the peak value and the base value are computed to produce a column ratio. The foregoing steps are repeated in the row direction to produce a row ratio. Finally, the column and row ratios are employed as a measure of the extent of blocking artifacts in the digital image.


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