The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2003
Filed:
Aug. 26, 2002
Applicant:
Inventor:
Yutaka Ikeda, Hyogo, JP;
Assignee:
Mitsubshi Denki Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 8/00 ;
U.S. Cl.
CPC ...
G11C 8/00 ;
Abstract
In a test mode, read data is output from a memory array with each of N latch circuits in an output circuit being set to an operating state under the control of a latency setting circuit. Thus, the data transmission period can be set shorter in the test mode than in a normal data reading operation, and a time required for testing the read data in the test mode is shortened.