The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2003
Filed:
Oct. 19, 2001
Yoshihiko Mizushima, Hamamatsu, JP;
Kazuji Matsumoto, Hamamatsu, JP;
Hamamatsu Photonics K.K., Shizuoka, JP;
Abstract
Light is made incident into an inhomogeneous medium, and transmitted light or reflected light is detected. The intensity of the detected light is represented by the linear sum of exponential functions of penetration depth using e as a base, or a function formed from the exponents and a function derived from the function. This function includes the physical quantity of the inhomogeneous medium as a coefficient. When light amount measurement data are acquired at a plurality of wavelengths or thicknesses, and the light intensity or other known information is substituted into the function and an expression derived from the function, the physical quantity of the inhomogeneous medium can be determined. Thus, an optical analysis method for an inhomogeneous medium, which is capable of accurate analysis, can be provided.