The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2003

Filed:

Jun. 29, 2001
Applicant:
Inventor:

Sylvie Chavanne, Saint-Etienne, FR;

Assignee:

Millipore Corporation, Billerica, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/100 ;
U.S. Cl.
CPC ...
G01N 2/100 ;
Abstract

The present invention relates to the monitoring of polymers during their processing by the determination of optical scattering properties. According to one aspect of the invention, there is provided a monitoring system for a vessel for polymer processing and the like, comprising a monitoring cell for measuring the optical properties of the contents of the vessel, a feed path and a return path both connecting the cell to the vessel, and a pump connected in the feed or return path. According to another aspect of the invention there is provided a monitoring cell for measuring the optical properties of the contents of the cell, including a source for generating a laser beam through the cell, and a detector for detecting light scattered from the laser beam, preferably a linear camera and an optical system for focusing scattered light thereon.


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