The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2003
Filed:
Feb. 21, 2002
Applicant:
Inventors:
Ze Xiang Shen, Singapore, SG;
Wanxin Sun, Singapore, SG;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/44 ; G01N 2/165 ;
U.S. Cl.
CPC ...
G01J 3/44 ; G01N 2/165 ;
Abstract
An apertureless near-field scanning Raman microscope using reflection geometry. A laser beam focused to a small spot size on a sample onto which a silver coated metal probe is positioned. With this arrangement, it is possible to obtain enhanced near-field spectroscopy using reflection geometry. Near-field spectroscopic mapping can be done in a short time without extensive sample preparation.