The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2003

Filed:

May. 13, 2002
Applicant:
Inventor:

Kazuo Nakagawa, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 3/08 ; G01C 3/00 ; G01C 5/00 ;
U.S. Cl.
CPC ...
G01C 3/08 ; G01C 3/00 ; G01C 5/00 ;
Abstract

There is provided a measuring device whose measuring accuracy is prevented from lowering when a plurality of lenses for guiding light rays to each of a plurality of photoelectric converters are integrated for the purpose of reduction in size. The measuring device is comprised of a composite optical part and a holding member. The composite optical parts is comprised of at least first and second photoelectric converters, and integrated first and second optical functional members that guide light rays to the first and second photoelectric converters. The holding member holds the first and second photoelectric converters and the composite optical part. The first and second optical functional members of the composite optical part are coupled so as to restrain light rays entering one of the first and second optical functional members and exiting from the other one of the first and second optical functional members from entering one of the first and second photoelectric converters corresponding to the other optical functional member.


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