The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2003
Filed:
Aug. 13, 2002
Joel M. Libove, Orinda, CA (US);
Steven J. Chacko, Mill Valley, CA (US);
Furaxa, Inc., Orinda, CA (US);
Abstract
A method and apparatus for generating multiple ultra-fast (picosecond-range) electrical sampling apertures and pulses in response to a slewed control signal is disclosed. In one embodiment a series or sequence of sampling apertures are formed for sampling an input signal without the use of delay lines. In another embodiment, the input to be sampled is incrementally delayed to generate signals along a delay line. The delayed signals are simultaneously sampled in a sampling window to obtain a group of samples of an input signal at the same time. In another embodiment, a series or sequence of ultra-fast pulses are formed in an output signal without using delay lines. Parallel and serial sampler/pulser circuitry are disclosed.