The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6642515 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 04, 2003

Filed:

Sep. 20, 2001
Applicant:
Inventor:

Kentaro Yamaguchi, Chiba, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 4/910 ;
U.S. Cl.
CPC ...
H01J 4/910 ;
Abstract

The invention is provides a method and an apparatus for performing electrospray ionization mass spectrometric analysis, which method can exactly analyze a mass of a molecular ion or a fragment ion of an unstable organometallic complex or a polymeric organic compound. The method includes cooling a sample to be analyzed which contains a solvent and is caused to flow out from a spray small-diameter tube with an inert gas for low temperature vaporization (A), and carrying out ionization and mass spectrometric analysis of the sample to be analyzed while cooling a chamber ( ) for removing a solvent or an ion source shield ( ) with liquid nitrogen.


Find Patent Forward Citations

Yamaguchi, Kentaro. (2003). Method and apparatus for electrospray mass spectrometric analysis (U.S. Patent No. 6642515). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6642515

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