The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2003
Filed:
May. 14, 2001
Fumio Sugaya, Kanagawa-ken, JP;
Yoichi Endo, Kanagawa-ken, JP;
Nobuaki Tokiwa, Kanagawa-ken, JP;
Akihiro Komatsu, Kanagawa-ken, JP;
Yoshihiro Seto, Kanagawa-ken, JP;
Fuji Photo Film Co., Ltd., Kanagawa-Ken, JP;
Abstract
An analysis method using a dry chemical analysis element accurately measures change in optical density indicating the composition of a liquid sample without requiring accurate control of the amount and position of the liquid sample dripped on the dry chemical analysis element. A one-dimensional or two-dimensional optical reading apparatus measures one-dimensional or two-dimensional distribution of degree of color reaction for a reacted portion of the dry chemical analysis element. Concurrently, the one-dimensional or two-dimensional optical reading apparatus measures a length or a spread area of the reacted portion. Physical density or activity of a target component contained in the liquid sample is determined based on an integrated value of the degree of the color reaction and the measured length or the spread area of the reacted portion.