The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6641962 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 04, 2003

Filed:

Feb. 28, 2003
Applicant:
Inventors:

Shinji Mizutani, Kanagawa-ken, JP;

Kazuya Ota, Tokyo, JP;

Masahiko Yasuda, Kanagawa-ken, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 9/00 ; G01B 1/100 ;
U.S. Cl.
CPC ...
G03F 9/00 ; G01B 1/100 ;
Abstract

An exposure method according to the present invention includes a first step of forming on a substrate an alignment mark including a concave and convex pattern; a second step of forming a coat over said alignment mark and the other area on said substrate; a third step of flattening said coat; and a fourth step of applying a photosensitive material on said coat flattened by said third step and projecting a mask pattern thereto. The alignment mark is formed by said concave and convex pattern arranged with a pitch which is smaller than the predetermined value between adjacent convex portions having a width of not less than a predetermined value.


Find Patent Forward Citations

Mizutani, Shinji. (2003). Micro devices manufacturing method utilizing concave and convex alignment mark patterns (U.S. Patent No. 6641962). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6641962

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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