The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2003

Filed:

Aug. 23, 1999
Applicant:
Inventors:

Frederick F. Becker, Houston, TX (US);

Peter R. C. Gascoyne, Belaire, TX (US);

Ying Huang, San Diego, CA (US);

Xiao-Bo Wang, San Diego, CA (US);

Jun Yang, Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/726 ; G01N 2/7447 ;
U.S. Cl.
CPC ...
G01N 2/726 ; G01N 2/7447 ;
Abstract

Methods and apparatus for discriminating matter in a chamber having an inlet port and an outlet port utilizing dielectrophoresis and field flow fractionation. A carrier medium is introduced into the inlet port and is directed from the inlet port to the outlet port according to a velocity profile. A programmed voltage signal is applied to an electrode element coupled to the chamber to form a dielectrophoretic force on the matter. The dielectrophoretic force is balanced with a gravitational force to displace the matter to positions within said velocity profile in the carrier medium to discriminate the matter. A chamber having a top and bottom outlet port may be utilized to withdraw a first portion of a carrier medium from the top outlet port at a first, controllable fluid flow rate and to withdraw a second portion of the carrier medium from the bottom outlet port at a second, controllable fluid flow rate.


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