The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2003
Filed:
Mar. 21, 2002
Applicant:
Inventors:
Boyce Carsella, Engleside, IL (US);
Leo Klinstein, Buffalo Grove, IL (US);
Assignee:
Magnetrol International Inc., Downers Grove, IL (US);
Primary Examiner:
Int. Cl.
CPC ...
G01F 2/300 ;
U.S. Cl.
CPC ...
G01F 2/300 ;
Abstract
A time domain reflectometry measuring instrument uses a microprocessor that provides added functionality and capabilities. The circuit electronics and probe are tested and calibrated at the factory. Installation and commissioning by the user is simple. The user installs the probe. The transmitter is attached to the probe. The user connects a standard shielded twisted pair to the electronics. Power is applied and the device immediately displays levels. A few-simple parameters may need to be entered such as output characteristics and the process material dielectric constant.