The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2003
Filed:
Aug. 07, 2000
Alexander Goldovsky, Philadelphia, PA (US);
Agere Systems Inc., Allentown, PA (US);
Abstract
An integrated circuit includes a semiconductor die having a plurality of input/output pads and a plurality of boundary scan cells. Each of the boundary scan cells includes a TDI input and a TDO output. A first boundary scan cell is the first boundary scan cell of the plurality of boundary scan cells to receive data. A last boundary scan cell is the last boundary scan cell of the plurality of boundary scan cells to receive data. An endless control conductor forms a loop proximate the plurality of boundary scan cells. The endless control conductor is coupled to each of the plurality of boundary scan cells to provide a test clock signal thereto. At least one other control conductor extends around the semiconductor die proximate the plurality of boundary scan cells. The at least one other control conductor is discontinuous between the first and last boundary scan cells.