The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 2003

Filed:

Jun. 19, 2001
Applicant:
Inventors:

Sanjatha Shringeri, Union City, CA (US);

Joy Hsu, Fremont, CA (US);

Assignee:

Informatica Corporation, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/730 ;
U.S. Cl.
CPC ...
G06F 1/730 ;
Abstract

A method of optimizing ranking queries in analytic applications. The method involves dividing a ranking query constructed by a user into multiple sub-commands. These sub-commands are based on the relationship between the foreign key and ranking attributes of a table of data and are run as a batch of commands. As usable data is extracted from each sub-command, it is stored and the foreign key is used as a filter for the next query in the batch. This eliminates accessing irrelevant data and facilitates the query operation. The extracted data is joined as the last step of the process in order to minimize the number of join operations performed by the query while the batch is being executed, thereby facilitating the query process.


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