The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2003
Filed:
Dec. 06, 2000
Turker Kuyel, Dallas, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
According to one embodiment of the present invention, a system ( ) for measuring overall jitter is disclosed that includes a data converter ( ) that measures a signal to generate a first measurement set ( ) and a second measurement set ( ), which are used to compute overall jitter. According to one embodiment of the present invention, a method for measuring overall jitter is disclosed. The data converter ( ) generates the first measurement set ( ) and the second measurement set ( ) by measuring the signal. The overall jitter is computed using the measurement sets ( and ). According to one embodiment of the present invention, a system ( ) for measuring internal jitter is disclosed that includes a splitter ( ) that splits a signal into an input signal ( ) and a clock signal ( ). The data converter ( ) measures the input signal ( ) to generate a first data set and a second data set, which are used to compute the internal jitter of the data converter ( ). According to one embodiment of the present invention, a method for measuring internal jitter is disclosed. A signal is split into an input signal ( ) and a clock signal ( ). The data converter ( ) measures the input signal to generate the first data set ( ) and the second data set ( ). The internal jitter is computed using the first data set ( ) and the second data set ( ). The external jitter is computed from the overall and internal jitter. The signal-to-noise ratio of the data converter ( ) is computed from the external jitter.