The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 2003

Filed:

Jun. 09, 2000
Applicant:
Inventors:

Akio Kosaka, Hachioji, JP;

Takao Shibasaki, Tokyo, JP;

Akito Saito, Hino, JP;

Takeo Asano, Kunitachi, JP;

Hiroshi Matsuzaki, Hachioji, JP;

Yukihito Furuhashi, Hachioji, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/05 ;
U.S. Cl.
CPC ...
A61B 5/05 ;
Abstract

A reference frame adapted to be fitted to a subject of medical treatment and provided with markers for determining the position or the orientation of the subject comprises fitting section for fitting the reference frame with the subject at least three spots (tops of the left and right ears and the nasal projection) along the undulations of the surface thereof and three or more than three markers detectable at least ether in an X-ray image or in an MRI image of the reference frame, the markers being to be arranged at predetermined positions not connectable by a straight line. A surgical operation navigating system determines the coordinates of the markers in a coordinate system defined for the image taken for the purpose of medical examination of the subject who is carrying the reference frame on the basis of the obtained image. Then the corresponding relationship is established between the coordinate system for the image for examination and the coordinate system for the real space containing the markers on the basis of the result of the operation of determining the coordinates of the markers in the coordinate system for the image for examination and the coordinates of the markers in the coordinate system for the real space.


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