The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 2003

Filed:

Dec. 28, 1999
Applicant:
Inventors:

Simon C. Borst, Convent Station, NJ (US);

Terry Si-Fong Cheng, Randolph, NJ (US);

Sudheer A. Grandhi, Lake Hiawatha, NJ (US);

Boris Dmitrievich Lubachevsky, Bridgewater, NJ (US);

Philip Alfred Whiting, New Providence, NJ (US);

Assignee:

Lucent Technologies Inc., Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04Q 7/20 ; H04Q 7/32 ;
U.S. Cl.
CPC ...
H04Q 7/20 ; H04Q 7/32 ;
Abstract

Disclosed is a method for improving call quality and capacity by integrating a dynamic channel allocation technique into an intelligent antenna system. The intelligent antenna systems includes beams which are grouped into sets, wherein each set has associated a long list and a primary short list, and each beam has associated a secondary short list. In one embodiment, long term interference levels are measured on each beam in a set of beams for a plurality of communication channels to produce the long list; short term interference levels are measured on each beam in the set of beams for a portion of the plurality of communication channels to produce a plurality of secondary short lists and the primary short list; and communication channels are assigned to a mobile-station from the portion of the plurality of communication channels based on the measured short term interference levels on each beam in the set of beams. The long list and the primary short list are based upon highest measured long and short term interference levels, respectively, for each of the plurality of communication channels across each beam in the set of beams.


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