The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2003
Filed:
Sep. 26, 2001
Stefan Schneider, Aachen, DE;
Josef Lauter, Aachen, DE;
Herfried Karl Wieczorek, Aachen, DE;
Olaf Such, Aachen, DE;
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
The invention relates to a method for scatter correction while forming a computed X-ray tomogram. The distribution of the scattered radiation is determined by detector cells ( ′) which, because of the measuring method carried out, are shielded from direct irradiation in a two-dimensional, multi-cell detector field ( ). This distribution is used to perform a scatter correction in the neighboring, directly irradiated detector cells ( ). Furthermore, scatter correction can be performed by computer simulation of the scatter processes. To this end, use is preferably made of a Monte Carlo method and the effect of the geometry and the material composition of the measuring arrangement, of the patient size, of the irradiated tissue and the like, is taken into account.