The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 2003

Filed:

Feb. 25, 2000
Applicant:
Inventors:

Jie Gu, Grand Blanc, MI (US);

Simon Chin-Yu Tung, Rochester Hills, MI (US);

Gary C. Barber, Novi, MI (US);

Assignee:

General Motors Corporation, Detroit, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 1/124 ; G06K 9/36 ;
U.S. Cl.
CPC ...
G01B 1/124 ; G06K 9/36 ;
Abstract

A contour measurement system determines three dimensional surface information of an object using a projection moiré technique to obtain a single fringe pattern that is analyzed using a phase-shift image processing method. A grating is projected onto the object and the reflected fringe pattern is recorded by a camera and stored digitally as an array of pixels. An estimated fringe spacing is then determined for each pixel. Using the estimated fringe spacings, four phase-shifted fringe patterns are generated by correlation integration and then used in a phase calculation to obtain wrapped phase information for the object. This phase information is then unwrapped and normalized, producing a set of data points representative of the unwrapped phase information. Noise suppression using pattern reconstruction and smoothing can be utilized at this point to improve the signal to noise ratio. Thereafter, updated estimated spacings are determined for each data point using a curve fitting function such as a localized least squares fit. The system then performs one or more additional iterations of the correlation integration, phase calculation, unwrapping, noise suppression, and fringe spacing update steps, each time using the newest updated estimated spacing in the correlation integration. After the final iteration, the unwrapped phase information is demodulated and used to calculate the three dimensional coordinates of points on the object surface. A fractional pixel analysis technique is also disclosed for use in the correlation integration and updated estimated spacing calculations.


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