The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2003
Filed:
Aug. 14, 2002
The Furukawa Electric Co., Ltd., Tokyo, JP;
Abstract
In a defect detecting method for detecting defect of a measured optical fiber, the defect of the optical fiber is detected on the basis of a pattern of the intensity distribution obtained by illuminating a laser beam on to the optical fiber, the pattern of the intensity distribution is subjected to a weak smoothing process and a strong smoothing process to form first and second pattern, respectively, and a judging pattern is formed on the basis of a difference or quotient between the first and second pattern, and then is subjected to Fourier transform to form a Fourier transform pattern which is evaluated by using double logarithmic axis, and judging curve having high contributing rate to the Fourier transform pattern is applied to the Fourier transform pattern, and the defect of the optical fiber is detected on the basis of magnitude of the dispersion of the Fourier transform pattern from the judging curve.