The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2003
Filed:
Jun. 26, 2001
Applicant:
Inventor:
Takayuki Takao, Kawasaki, JP;
Assignee:
Agilent Technologies, Inc., Palo Alto, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/128 ;
U.S. Cl.
CPC ...
G01R 3/128 ;
Abstract
A semiconductor parametric testing apparatus includes designating a die and module on each wafer at which a test should be paused and pausing a test at the preselected die and module on each wafer.
Takao, Takayuki. (2003). Semiconductor parametric testing apparatus (U.S. Patent No. 6639417). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6639417
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile