Methods and apparatus for time-domain measurement with a high frequency circuit analyzer

Abstract

A method of measuring the response of an electronic device to a high frequency input signal is performed with an analyzer ( ). The method includes providing an electronic device (for example a transistor or amplifier) to be tested, providing a measurement system ( , SA, SB) including a microwave transition analyzer (MTA) ( ) connected to the device, applying a signal to the device and measuring with the MTA ( ) the resulting incident and reflected waves at a port ( ) of the device, ascertaining first calibration data regarding the measurement system ( , SA, SB), processing signals representative of the waves as measured by the MTA ( ), with the use of the first calibration data, to compensate for the influence of the measurement system and the connection between the MTA ( ) and the device on the waves between the port ( ) of the device and the MTA to produce vector corrected s-parameters, ascertaining, by measuring signals at a port of the device with a real network with known properties, second calibration data concerning voltage waveforms at the port, and processing said vectors corrected s-parameters with the use of the second calibration data to produce output signals from with the absolute values of the magnitude and phase of waves at the port of the device may be directly ascertained. The method is of use in improving the efficiency and power capabilities of amplifiers for use in mobile communication base stations.