The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 2003

Filed:

Feb. 28, 2002
Applicant:
Inventors:

Nobuyoshi Kogawa, Tokyo, JP;

Hiroshi Kitaguchi, Tokyo, JP;

Tetsuya Matsui, Tokyo, JP;

Akihisa Kaihara, Tokyo, JP;

Junichi Arita, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/700 ; G01N 2/762 ;
U.S. Cl.
CPC ...
G01N 2/700 ; G01N 2/762 ;
Abstract

A highly sensitive charged particle measuring device capable of measuring low-level alpha rays comprises in a measurement chamber provided with a sealable door , a test sample and a semiconductor detector , a radiation measuring circuit including a preamplifier connected to the semiconductor detector , a linear amplifier , and a pulse height analyzer , a charged particle emission amount arithmetic unit for performing the quantitative analysis of charged particles from its measurement, a display unit for displaying its analysis result, and further has an evacuation pipe line and a pure gas supply pipe line for performing supply and replacement of the pure gas in the measuring chamber


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