The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2003
Filed:
Mar. 14, 2002
Tomohiro Taira, Chitose, JP;
Other;
Abstract
A probe inspection system is used in integrated circuit fabrication and testing, using a network, including probers, testers, manufacturing specification management, testing step control and test results management, which has a modified prober software. Lots are set successively to cassettes, and when the lot in another cassette is set after the end of processing of the lot in one cassette, processing of the next lot is executed automatically. Continuous lot inspection can be effected by repeating these operations. Even during processing of the next lot, it is always possible to change lot in the processing-completed cassette and input data, such as lot No. In probe check in wafer testing, it is possible to diminish the working load and the waiting of workers in the lot change, reduce the number of cassettes and improve the working efficiency of testers.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile