The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2003
Filed:
Dec. 14, 2001
Applicant:
Inventor:
Ronald J. Martino, Geneva, NY (US);
Assignee:
Bausch & Lomb Incorporated, Rochester, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 ;
U.S. Cl.
CPC ...
A61B 3/10 ;
Abstract
A wavefront sensor for measuring ocular aberrations includes a calibration test component and comparative calibration measurement information stored in the device to insure that the device is properly calibrated for reliable aberration measurement. Wavefront calibration, focusing calibration, and retinal illumination level monitoring are contemplated calibration measurements. An optional interlock function prevents diagnostic/therapeutic operation of the aberrometer if it is out of calibration or unsafe for use. A method for calibrating an aberrometer is described.