The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2003

Filed:

Nov. 17, 1999
Applicant:
Inventors:

Toshiaki Kirihata, Poughkeepsie, NY (US);

L. Brian Ji, Fishkill, NY (US);

John Ross, Poughkeepsie, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 7/00 ;
U.S. Cl.
CPC ...
H04L 7/00 ;
Abstract

Digital latency shift communication problems from a driver chip to a receiver chip are overcome by scheduling a data output latency, a data input latency, a data output command, and/or a data output command, such that data outputted by the driver chip is received by the receiver chip at the correct time. A digital shift detection circuit detects the offset of the actual latencies from predetermined latencies. The offset of the latency is fed back to the scheduling circuit to override the predetermined latencies and/or command inputs that control the chip. The offset can be directly back-fed to the chip driver or chip receiver to compensate for digital shifts. Digital shift detection is achieved by measuring actual latencies with a manufacturing stand-alone tester, or with a built-in tester integral to the system. The digital shift detection predicts the conditions that create a digital shift by way of a mathematical model.


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